Industrial and Practical Test Engineering

The purpose of the session is to provide a forum to exchange ideas and to discuss developments and challenges in practical test technology.

Topics of interest include (but are not limited to):

• Challenges and practical solutions of Today's Production Test
• Current Trend for Higher Pincount, Multisite Probing
• Reduction Test Programme Development Cycle Time
• QFN/MLF package EOL Test, sort, handling.
• Challenge and ATE Requirements for Semiconductor Foundries
• Improving Test Cell Operating Equipment Effectiveness
• Advances in Test Technology
• Mixed Signal Test Trends
• Memory Device Test Trends
• Testing System on Chip
• Third Generation Wireless Device Test Solution
• ATE Trend – Open Vs Close Architectural

Organizers: Dr. Victor Lai and Zainal Abu Kassim, both - Freescale Semiconductor Malaysia (Victor.Lai@freescale.com , Zainal.AbuKassim@freescale.com )