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Diagnostic in deep submicron electronic technologiesThe purpose of a Diagnostic test is isolation or identification of a faulty part. With the advent of present day micro/nanoelectronic technologies, diagnosis is becoming more and more important and definitively mandatory for fast yield ramp-up and crucial for profitability. This special session will focus on new advances in diagnosis of electronics systems and is intended to bring together researchers and practitioners working in this field. Contact details: Christian Landrault
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