VP-SEM
Variable Pressure Scanning Electron Microscope (VP-SEM)
Hitachi S3400N-II
VP-SEM provides a resolution of 3nm at 30kV (high vacuum mode) and 4nm at 30kV (variable pressure mode). Their high sensitivity back scattered electron detector permits the high quality imaging at low kV. Large chamber allows imaging of samples as tall as 80 mm even at analytical working distance.
Charges
Led by our skilled technical officers, we offer analysis services for external users. We also extend our services to train users undertaking long term or intensive projects which require many hours of analysis time. Our competitive rates are based on the type of analysis and number/type of samples.
Note:
- For internal users, please contact the respective technical officer.
- Prices may be subject to change. For exact quotations please contact the respective technical officer.
- 8% SST will be included in the official quotation.
| Service Type | Unit of Measurement | Academic | Corporate/Industry |
|---|---|---|---|
| VP-SEM Imaging | per sample | 240 | 300 |
| VP-SEM Surface and Cross Section Imaging | per sample | 240 | 300 |
Booking
To request an official quotation, please fill up the form here.
Please allow a lead time at least 3 days to review the submission.
Contact
For any further inquiries and booking, please contact the respective persons below:
 | Prof. Ir. Dr. Chai Siang Piao (FESEM & VPSEM Coordinator) E-mail: chai.siang.piao@monash.edu Tel: (+603) 5514 6234 |
 | ChM. Ts. Afiq bin Anwar (Senior Technical Officer) Email: afiq.anwar@monash.edu Tel: (+603) 55145649 |
Location
Level 1, Building 5,
Monash University Malaysia
Jalan Lagoon Selatan
47500 Bandar Sunway
(Location map)